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NDT Solution
Electronic Speckle Pattern Interferometry
Applied to the Characterization of Materials at Elevated Temperature
by Gopalakrishna K. Bhat*
.
| Developing noninvasive
measurement techniques for the characterization of materials at
high temperatures is vital for the aerospace, automotive, and
nuclear industries. Currently used techniques for material testing
at high temperatures include holography, speckle interferometry,
and moire interferometry. In this article, the author presents
an electronic speckle pattern interferometric (ESPI) technique
for the quantitative measurement of in-plane deformation and strains
at very high temperatures.
G.P. Singh
Associate Contributing Editor |
Knowledge of the mechanical behavior
of materials at elevated temperatures is vital for the design of structural
components in various fields such as aerospace, automotive, and nuclear
engineering. It is desirable to visualize the response of the structure
to applied loads under actual working conditions. Conventional invasive
transducers such as strain gages, which provide local strain information,
may not be reliable at extremely high temperatures. Optical noninvasive
measurement techniques such as holography, speckle interferometry, and
moiré are attractive for material testing at high temperatures
because they provide full field displacement and strain information.
Earlier optical work related to full field displacement
and strain measurements on very hot objects is rather scarce. According
to a review article (Sciammarella, 1982), moiré techniques have
been used to measure in-plane deformations up to 600 ºC (1,112
ºF). Measurements in the same temperature range, using the high
resolution moiré technique, have also been reported (Burch and
Forno, 1982). Speckle photography was applied for the measurement of
strains up to 900 ºC (1,652 ºF) by Stetson (1981). Kang et
al. (1990) reported the application of high sensitivity moiré
interferometry for the measurement of deformations up to 550 ºC
(1,022 ºF). In ordinary holographic interferometry, there is the
early work of Evensen et al. (1972), who used a pulsed laser to record
the vibrations of panels heated up to 1,150 ºC (2,102 ºF).
Lockberg et al. (1985) and Malmo et al. (1988) employed electronic speckle
pattern interferometry for the visualization of deformation fringes
in objects above 1,000 ºC (1832 ºF). This paper presents an
electronic speckle pattern interferometric technique which can be used
for the quantitative measurement of displacement and strains at very
high temperatures.
Electronic speckle pattern interferometry is an attractive
technique for the characterization of materials at elevated temperatures.
Electronic Speckle Pattern Interferometry
Electronic speckle pattern interferometry (ESPI) is also called electro-optic
holography or TV holography, in the literature. Extensive literature
on the application of ESPI for the measurement of static and dynamic
displacements at normal temperatures can be found in Holographic
and Speckle Interferometry (Jones and Wykes, 1989). Figure 1 shows
an ESPI system which can be used to measure in-plane displacements and
strains. The test object is illuminated using two laser beams which
make equal angles with the surface normal to the object. The image of
the object is formed on the detector of a video camera using a system
of lenses. The image captured by the video camera is processed using
a digital image processor.
Figure 1 - ESPI system for
the measurement of in-plane displacements.
To obtain the fringes corresponding to the displacement
field, two images of the object are needed: one before deformation,
and the other after deformation. The image of the object illuminated
by laser light has a random distribution of speckles, which are extremely
sensitive to the motion of the object's surface. The intensity distribution
in the image of the object before deformation can be expressed as
(1) 
where I0(x, y) is the background
intensity, I1(x, y) is the amplitude and ø
(x, y) is the relative phase between the two interfering light
waves (Jones and Wykes, 1989). Intensity distribution in the image of
the object after deformation can be expressed as
(2) 
where ø (x,
y) is the phase change due to the deformation field. Subtractive
superposition of the two images above produces a fringe pattern corresponding
to the deformation field, which can be written as,
(3) 
The term [1 - cos ø
(x, y)] in Equation 3 represents the fringe pattern corresponding to
the deformation field; the remaining terms constitute the background
noise. The deformation fringe can be observed in real time by performing
the superposition of the two images inside a digital image processor.
Equation 3 was derived under the assumption that
the deformation field introduces change in the phase of the speckles
in the image of the object only, leaving their amplitudes unchanged.
In practice, however, there is also a small change in the amplitude
of the speckles due to object deformation. The amplitude of the speckles
can also change due to oxidation of the object surface. In view of this,
an equation governing the deformation fringe pattern can be expressed
as:
(4) 
where Ib(x, y) is the background
intensity and (x, y)
is the fringe visibility. The phase change ø (x, y) corresponding to the deformation
field can be separated from the noisy background using the digital filtering
technique (Sciammarella and Bhat, 1991). The displacement field can
then be obtained by multiplying the phase map by the sensitivity constant
for the optical system and the strain field can be computed by differentiating
the displacement field.
Measurement of Deformations and Strains
at High Temperatures
ESPI is applied for the measurement of in-plane deformations and strains
at high temperatures. In the first experiment, the technique is used
to measure the coefficient of thermal expansion of a rectangular bar
of Haynes alloy No. 25. The specimen is heated in an oven which can
attain a temperature of 1000 ºC (1832 ºF). The oven has three
windows made of high temperature glass, two for laser illumination and
the third for observation. The temperature inside the oven is measured
using three thermocouples and the temperature is regulated using a temperature
controller.
Figure 2 - Thermal expansion
fringes in the Haynes alloy bar at 1,000 ºC (1832 ºF).
The specimen is heated to the desired temperature
inside the oven. After the temperature is stabilized, the reference
image is captured and stored in the image processor. The temperature
is increased by 10 ºC (18 ºF) and the second image is captured
after the temperature is stabilized. Fringes corresponding to the thermal
expansion are obtained by the subtractive superposition of the two images
above. Figure 2, for example, shows the thermal expansion fringes in
the Haynes alloy bar at 1,000 ºC (1,832 ºF). A digital filtering
technique is employed to analyze the fringes and obtain the elongation
of the bar due to thermal expansion. Then, the coefficient of thermal
expansion is obtained using the relation
(5) 
where L is the initial length of the bar,
L is the change in length due to
thermal expansion, and T
the temperature gradient applied to the specimen. Figure 3 shows a plot
of the thermal expansion coefficients of Haynes alloy No. 25 measured
at high temperatures, along with the values supplied by the manufacturer,
which are based on the expansion of the specimen occurring between room
temperature and the desired temperature, whereas the values obtained
using speckle interferometry are local values at the desired temperature.
.
Figure 3 - Thermal expansion
coefficient of Haynes alloy at high temperatures.
.
In the second experiment, ESPI is employed for the
measurement of strains in a disk of Haynes alloy, subjected to diametral
compression at 1,000 ºC (1,832 ºF). The optical setup is the
same as that used for the first experiment. A loading device is incorporated
within the oven used for heating the specimen. The specimen is supported
on a rigid ceramic base and the diametral compression is applied using
a pneumatic cylinder with a piston.
The specimen is held at the desired temperature
inside the oven and subjected to diametral compression. The displacement
fringes are obtained by superimposing the image of the object before
loading with that after loading. A digital filtering technique is used
to analyze the fringes and obtain the displacement and strain fields.
Figure 4, for example, shows the fringes (noise-free) corresponding
to the displacements perpendicular to the loading direction, in the
central portion of the Haynes alloy disk, obtained at 1,000 ºC
(1,832 ºF). Figures 5 and 6 show the displacement and strain fields
corresponding to the fringe pattern above, respectively.
.
Figure 4 - Fringes corresponding to the
displacements perpendicular to the loading direction, in the central
portion of the Haynes alloy disk subjected to diametral compression,
at 1,000 ºC (1,832 ºF).
Figure 5 - Displacement
field corresponding to the fringe pattern shown in Figure 4
(micrometers).
Figure 6 - Strain
field corresponding to the fringe pattern shown in Figure
4 (microstrain).
Figure 7 - Fringes due to
creep in the Haynes alloy disk at 1,000 ºC (1,832 ºF).
.
Since the deformation fringes are displayed on a
video monitor in real time, it is possible to visualize the material
creep at high temperatures. Figure 7, for example, shows the fringes
due to creep in the Haynes alloy disk held under constant diametral
load, at 1,000 ºC (1,832 ºF).
Problems Encountered at High Temperatures
Several problems are encountered while recording images at high temperatures.
When the specimen is heated up to 1,000 ºC (1,832 ºF), its
surface starts oxidizing. This oxidation changes the surface texture
of the object, which results in the decorrelation of the speckles in
the image of the object. Decorrelation of the speckles results in a
drastic reduction in the visibility of the displacement fringes. This
oxidation of the specimen surface can be prevented by coating it with
a ceramic paint which can withstand high temperatures.
When the object is heated, it starts radiating energy
at various wavelengths. The energy radiated by the object surface at
1,000 ºC (1,832 ºF) is much stronger than energy of the laser
light scattered from its surface. The radiation is recorded by the video
camera as a background bias, which results in reduction in the visibility
of the speckles and, hence, that of the displacement fringes. If the
radiation is sufficiently strong, it may even saturate the camera detector.
The background radiation can be prevented from reaching the camera detector
by introducing a narrow band interference filter in front of the camera,
which passes wavelengths near the laser wavelength only.
Another problem encountered at high temperatures
is the phase perturbations introduced by the thermal convection currents
flowing around the specimen. Thermal currents change the refractive
index of the air surrounding the specimen and hence introduce phase
changes in the laser beam propagating through it. The problem of thermal
currents can be overcome by evacuating the oven. In the optical configuration
shown in Figure 1, both laser beams pass through the same medium in
surrounding the specimen. The relative phase changes due to thermal
currents are therefore very small. The phase perturbations due to thermal
currents can be minimized by recording several successive images of
the fringe pattern and averaging their phase values.
Conclusion
Electronic speckle pattern interferometry is an attractive technique
for the characterization of materials at elevated temperatures. The
technique provides full field displacement and strain information, and
it is noninvasive. The use of a video camera to record the images of
the test object and a digital image processor to process them enables
the visualization of full field displacement fringes in real time. Digital
fringe analysis technique yields quantitative information on the displacement
and strain fields. The technique is successfully employed for the measurement
of thermal expansion coefficient of Haynes alloy No. 25 at high temperatures
and to study the material response to static loads at 1,000 ºC
(1,832 ºF).
Acknowledgments
The research work presented in this paper was carried out while the
author was at the Illinois Institute of Technology, Chicago. The financial
assistance and encouragement of C.A. Sciammarella is gratefully acknowledged.
References
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Evensen, D.A., R. Aprahamian, and K.R. Overoye,
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Holographic Interferometry," NASA Contract Report 2028,
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Jones, R., and C. Wykes, Holographic and Speckle
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* Strainoptic Technologies, Inc., 108 W. Montgomery Ave., North
Wales, PA 19454; (215) 661-0100; fax (215) 661-0100; fax (215) 699-7028;
e-mailgbhat@erols.com.
Copyright © 1998 by
the American Society for Nondestructive Testing, Inc. All rights reserved.
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