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NDT Solution

Electronic Speckle Pattern Interferometry Applied
to the Characterization of
Materials at Elevated Temperature

 

Figures 5-7

 

  Figure 5

Figure 5 - Displacement field corresponding to the fringe pattern shown in Figure 4 (micrometers).

 [ Back to January '98 NDT Solution ]

 

Figure 6

Figure 6 - Strain field corresponding to the fringe pattern shown in Figure 4 (microstrain).

[ Back to January '98 NDT Solution ]

 

 

Figure 7

Figure 7 - Fringes due to creep in the Haynes alloy disk at 1,000 ºC (1,832 ºF).

[ Back to January '98 NDT Solution ]


Copyright © 1998  by the American Society for Nondestructive Testing, Inc. All rights reserved.

[ Materials Evaluation ]

 

 
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