Recommended Practice No. SNT-TC-1A
Personnel Qualification and Certification in Nondestructive Testing
Summary
Recommended Practice No. SNT-TC-1A: Personnel Qualification and Certification in Nondestructive Testing (2006) provides guidelines for employers wishing to establish in-house certification programs. SNT-TC-1A establishes the general framework for a qualification and certification program. In addition, the document provides recommended educational, experience and training requirements for the different test methods. The 2006 edition of SNT-TC-1A included several changes from past editions:
- Limited certifications were defined for Level II in digital radiography, film interpretation, ultrasonic A-scan and digital thickness measurement.
- Magnetic flux leakage was acknowledged as a separate test method.
- The electromagnetic testing method was subdivided into four techniques, with specific training and experience requirements for each.
- Level I and II recertification cycles were increased from three to five years.
- The “Recommended Training Course Outlines” appearing in past editions of SNT-TC-1A were replaced by ANSI/ASNT CP-105.
Purchase
SNT-TC-1A (2006) is sold as a package with ANSI/ASNT CP-105: Training Outlines for Qualification of Nondestructive Personnel (2006). Go to ShopASNT to purchase in hard copy.
Interpretations
Full text of Interpretations of SNT-TC-1A are available in Interpreting SNT-TC-1A, sixth edition. This publication is also accessible in ASNT Members Only.
Request an Interpretation
Download the interpretation form in Adobe Acrobat.
SNT-TC-1A Review Committee
Michael J. Ruddy, Chair
Thom Schafer, Vice Chair
Michael W. Allgaier
Alfred L. Broz
Robert E. Cameron
Eugene J. Chemma
James E. Cox
David L. Culbertson
Claude D. Davis
Nat Y. Faransso
Karl Fogleman
Darrell W. Harris
Gary Heath
R. Keith Holt
Morteza K. Jafari
Jim F. Kelly
Ronald W. Kruzic
Charles P. Longo, ex officio
Joseph L. Mackin
Walter R. Matulewicz
Michael E. McDaniel
Raymond G. Morasse
Ricky L. Morgan
William J. Norton, Jr.
Matthew L. Patience
Mark R. Pompe
Robert J. Potter
Kirit V. Smart
Marvin W. Trimm
Ray R. Tsukimura
Roland J. Valdes
David J. Vigne
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